ImageMaster® PRO 5 Wafer / 產線用快速高精度MTF測量儀-5-晶圓

ImageMaster® PRO 5 Wafer
Highly efficient wafer level measurement
  • Digital camera technology
  • MTF on 13 field positions (sag + tan)
  • Adjustable field angles up to FOV 165deg
  • Measurement time less than 2.5 sec/lens
  • Automatic X-Y tray system 225 x 225mm²
  • Up to 8 inch wafer level optics (WLO)
  • Accurate FFL measurement with optical sensor
  • Measurement time fixed focus scan 1 sec/lens
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